MVMS-RCN: A Dual-Domain Unfolding CT Reconstruction with Multi-sparse-view and Multi-scale Refinement-correction
Abstract
X-ray Computed Tomography (CT) is one of the most important diagnostic imaging techniques in clinical applications. Sparse-view CT imaging reduces the number of projection views to a lower radiation dose and alleviates the potential risk of radiation exposure. Most existing deep learning (DL) and deep unfolding sparse-view CT reconstruction methods: 1) do not fully use the projection data; 2) do not always link their architecture designs to a mathematical theory; 3) do not flexibly deal with multi-sparse-view reconstruction assignments. This paper aims to use mathematical ideas and design optimal DL imaging algorithms for sparse-view tomography reconstructions. We propose a novel dual-domain deep unfolding unified framework that offers a great deal of flexibility for multi-sparse-view CT reconstruction with different sampling views through a single model. This framework combines the theoretical advantages of model-based methods with the superior reconstruction performance of DL-based methods, resulting in the expected generalizability of DL. We propose a refinement module that utilizes unfolding projection domain to refine full-sparse-view projection errors, as well as an image domain correction module that distills multi-scale geometric error corrections to reconstruct sparse-view CT. This provides us with a new way to explore the potential of projection information and a new perspective on designing network architectures. All parameters of our proposed framework are learnable end to end, and our method possesses the potential to be applied to plug-and-play reconstruction. Extensive experiments demonstrate that our framework is superior to other existing state-of-the-art methods. Our source codes are available at https://github.com/fanxiaohong/MVMS-RCN.
- Publication:
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arXiv e-prints
- Pub Date:
- May 2024
- DOI:
- 10.48550/arXiv.2405.17141
- arXiv:
- arXiv:2405.17141
- Bibcode:
- 2024arXiv240517141F
- Keywords:
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- Electrical Engineering and Systems Science - Image and Video Processing;
- Computer Science - Computer Vision and Pattern Recognition
- E-Print:
- 12 pages, submitted