Impact of iso-structural template layer on stabilizing pyrochlore Bi2Rh2O7

We present an epitaxial stabilization of pyrochlore Bi₂Rh₂O₇ on the Y-stabilized ZrO₂ (YSZ) (111) substrate by inserting a pyrochlore Eu₂Ti₂O₇ template layer, otherwise Bi-based layered structures being formed directly on the YSZ (111) substrate. This result reveals that "iso-structural crystal phase" plays an important role in the interfacial phase control. The Bi₂Rh₂O₇ film exhibits p-type electrical conduction with the lowest longitudinal resistivity ( ρ xx) among the reported Rh pyrochlore oxides. Such parameters as ρ xx, carrier density, and mobility show almost no temperature dependence in the measured range of 2-300 K.