An iterative method for reference pattern selection in high resolution electron backscatter diffraction (HR-EBSD)
Abstract
For high (angular) resolution electron backscatter diffraction (HR-EBSD), the selection of a reference diffraction pattern (EBSP0) significantly affects the precision of the calculated strain and rotation maps. This effect was demonstrated in plastically deformed body-centred cubic and face-centred cubic ductile metals (ferrite and austenite grains in duplex stainless steel) and brittle single-crystal silicon, which showed that the effect is not only limited to measurement magnitude but also spatial distribution. An empirical relationship was then identified between the cross-correlation parameter and angular error, which was used in an iterative algorithm to identify the optimal reference pattern that maximises the precision of HR-EBSD.
- Publication:
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arXiv e-prints
- Pub Date:
- June 2022
- DOI:
- 10.48550/arXiv.2206.10242
- arXiv:
- arXiv:2206.10242
- Bibcode:
- 2022arXiv220610242K
- Keywords:
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- Condensed Matter - Materials Science
- E-Print:
- doi:10.1016/j.ultramic.2023.113705