A CAM-Based Weakly Supervised Method for Surface Defect Inspection Wu, Xiaojun ; Wang, Tuo ; Li, Yiming ; Li, Peng ; Liu, Yunhui Abstract Publication: IEEE Transactions on Instrumentation Measurement Pub Date: 2022 DOI: 10.1109/TIM.2022.3168895 Bibcode: 2022ITIM...7168895W