Characterizing ultralow emittance electron beams using structured light fields

Novel schemes for generating ultralow emittance electron beams have been developed in past years and promise compact particle sources with excellent beam quality suitable for future high-energy physics experiments and free-electron lasers. Current methods for the characterization of low emittance electron beams such as pepperpot measurements or beam focus scanning are limited in their capability to resolve emittances in the sub 0.1 mm mrad regime. Here we propose a novel, highly sensitive method for the single shot characterization of the beam waist and emittance using interfering laser beams. In this scheme, two laser pulses are focused under an angle creating a gratinglike interference pattern. When the electron beam interacts with the structured laser field, the phase space of the electron beam becomes modulated by the laser ponderomotive force and results in a modulated beam profile after further electron beam phase advance, which allows for the characterization of ultralow emittance beams. 2D PIC simulations show the effectiveness of the technique for normalized emittances in the range of ɛ_n=[0.01 ,1 ] mm mrad .