Combined approach using circular intensity differential scattering microscopy under phasor map data analysis Mohebi, Ali ; Le Gratiet, Aymeric ; Marongiu, Riccardo ; Callegari, Fabio ; Bianchini, Paolo ; Diaspro, Alberto Abstract Publication: Applied Optics Pub Date: February 2021 DOI: 10.1364/AO.417677 Bibcode: 2021ApOpt..60.1558M