Multiple Layout-Hardening Comparison of SEU-Mitigated Filp-Flops in 22-nm UTBB FD-SOI Technology
Abstract
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- January 2020
- DOI:
- 10.1109/TNS.2019.2956171
- Bibcode:
- 2020ITNS...67..374C