Modeling Field Effect in Black Silicon and Its Impact on Device Performance Heinonen, Juha ; Pasanen, Toni P. ; Vahanissi, Ville ; Juntunen, Mikko A. ; Savin, Hele Abstract Publication: IEEE Transactions on Electron Devices Pub Date: April 2020 DOI: 10.1109/TED.2020.2975145 Bibcode: 2020ITED...67.1645H