Development of 2T-SONOS Cell Using a Contamination-Free Process Integration for a Highly Reliable Code Storage eNVM
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- March 2020
- DOI:
- 10.1109/TED.2020.2966501
- Bibcode:
- 2020ITED...67..922P