Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs Park, Jun-Young ; Moon, Dong-Il ; Lee, Geon-Beom ; Choi, Yang-Kyu Abstract Publication: IEEE Transactions on Electron Devices Pub Date: March 2020 DOI: 10.1109/TED.2020.2964846 Bibcode: 2020ITED...67..777P