Degradation of Radiation-Hardened Vertical Double-Diffused Metal-Oxide-Semiconductor Field-Effect Transistor During Gamma Ray Irradiation Performed After Heavy Ion Striking
Abstract
- Publication:
-
IEEE Electron Device Letters
- Pub Date:
- February 2020
- DOI:
- 10.1109/LED.2019.2961259
- Bibcode:
- 2020IEDL...41..216L