X-ray measurements of highly charged Ar plasma produced in the SAO EBIT

Highly charged ions (HCIs) are ubiquitous throughout the Universe. X-rays produced by inner shell transitions in HCIs provide sensitive probes into the physical conditions of the host plasma, given that the underlying atomic processes are well understood. Electron Beam Ion Traps (EBITs), containing a tunable, quasi-monoenergetic electron beam typically capable of producing all charge states of astrophysically relevant elements, are small-scale laboratory devices well-suited for systematic atomic physics studies. We present an update on the revitalization project currently underway at the EBIT facility at the Harvard-Smithsonian Center for Astrophysics (CfA) and show initial X-ray measurements of highly charged argon (Ar), obtained with a lithium-drifted silicon detector. The horizontally oriented EBIT, referred to as the Smithsonian Astrophysical Observatory (SAO) EBIT, includes a cryogen-free closed-cycle cryocooler system that allows for long, uninterrupted measurements needed to produce highly accurate atomic data. Renovations to the SAO EBIT thus far include the addition of a neutral gas injection system, the redesign of a number of thermal components, and an improved collector assembly. The enhancements increase the number of accessible elements and achievable charge states. Future plans include the installation of a metal-vapor vacuum arc (MeVVA) system and a high energy resolution X-ray microcaolorimeter. With these additional updates, the CfA user facility will be well-suited to provide the astrophysics community with the accurate atomic data required for future satellite missions such as the X-Ray Imaging and Spectroscopy Mission (XRISM).