Acceptor removal - Displacement damage effects involving the shallow acceptor doping of p-type silicon devices
Abstract
- Publication:
-
The 28th International Workshop on Vertex Detectors. 13-18 October
- Pub Date:
- October 2019
- DOI:
- 10.22323/1.373.0027
- Bibcode:
- 2019iwvd.confE..27M