Surface structure characterization by X-ray photoelectron diffraction of Sn ultra-thin films deposited on Pd(111)
Abstract
The formation of surface alloys obtained by annealing ultra-thin films of Sn deposited on a Pd(111) surface was characterized by X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD). Annealing the surface at 600 K produced a (√{ 3} x√{ 3})R30° LEED pattern, and the comparison between experimental and theoretical XPD results indicated the formation of a corrugated bi-dimensional Pd2Sn surface alloy, with Sn atoms being present not only on the outmost layer but also at least on the second internal layer.
- Publication:
-
Surface Science
- Pub Date:
- July 2019
- DOI:
- 10.1016/j.susc.2019.01.014
- Bibcode:
- 2019SurSc.685....7P