Surface morphology formation of Ti films in laser-induced forward transfer
Abstract
Titanium is frequently adopted in laser-induced forward transfer (LIFT) due to its unique industrial advantages (low density, high specific strength and good corrosion resistance). To understand the LIFT process assisted with Ti films, topographies of on Ti films with a thickness 435 {nm} ≤slant {d}≤slant 1250 {nm} 435 nm ≤ d ≤ 1250 nm irradiated by ultraviolet nanosecond laser pulses are investigated. Five different topographies (the pit, blister, bump, spray, and strip) are observed and classified, among which the pit, with a basin-like profile, is first addressed in this work. The probability distribution of these types with respect to laser fluence on 435 nm and 1250 nm Ti films is provided and an analytical model is developed to explain the driving mechanism of the ablation threshold and the formation of different topographies.
- Publication:
-
Surface Topography: Metrology and Properties
- Pub Date:
- June 2019
- DOI:
- 10.1088/2051-672X/ab295e
- Bibcode:
- 2019SuTMP...7b5022Z
- Keywords:
-
- laser-induced forward transfer;
- blister;
- titanium film;
- ablation threshold