Application of wavelet analysis on transient reflectivity in ultra-thin films Sarraf, S. Yousefi ; Trappen, R. ; Kumari, S. ; Bhandari, G. ; Mottaghi, N. ; Huang, C. Y. ; Cabrera, G. B. ; Bristow, A. D. ; Holcomb, M. B. Abstract Publication: Optics Express Pub Date: May 2019 DOI: 10.1364/OE.27.014684 Bibcode: 2019OExpr..2714684S