Ni(111) Thin Layers Recrystallization Studied by SEM, EBSD and AFM Teklinska, Dominika ; Jozwik, Iwona ; Knyps, Piotr Abstract Publication: Microscopy and Microanalysis Pub Date: August 2019 DOI: 10.1017/S143192761901064X Bibcode: 2019MiMic..25S1982T