Electron Microscopy and Spectroscopy Characterization of the Effects of Annealing on the Cu/Graphene/Si Multilayer Thin Films
Abstract
- Publication:
-
Microscopy and Microanalysis
- Pub Date:
- August 2019
- DOI:
- 10.1017/S1431927619010328
- Bibcode:
- 2019MiMic..25S1918S