4D Atomic Electron Tomography Miao, Jianwei ; Zhou, Jihan ; Yang, Yongsoo ; Yang, Yao ; Kim, Dennis S. ; Yuan, Andrew ; Tian, Xuezeng ; Ophus, Colin ; Sun, Fan ; Schmid, Andreas K. ; Nathanson, Michael ; Heinz, Hendrik ; An, Qi ; Zeng, Hao ; Ercius, Peter Abstract Publication: Microscopy and Microanalysis Pub Date: August 2019 DOI: 10.1017/S1431927619009802 Bibcode: 2019MiMic..25S1814M