Application of Low kV EELS to Problematic Samples Formo, Eric V. ; Howe, Jane Y. ; Sunaoshi, Takeshi ; Muto, Atsushi ; Kilcrease, Jim ; Salguero, Tina Abstract Publication: Microscopy and Microanalysis Pub Date: August 2019 DOI: 10.1017/S1431927619003064 Bibcode: 2019MiMic..25S.466F