A Workflow for Imaging 2D Materials using 4D STEM-in-SEM Caplins, Benjamin W. ; White, Ryan M. ; Holm, Jason D. ; Keller, Robert R. Abstract Publication: Microscopy and Microanalysis Pub Date: August 2019 DOI: 10.1017/S143192761900182X Bibcode: 2019MiMic..25S.218C