Resistive Switching Studies of ReRAM Devices by In-Situ TEM Martín, Gemma ; González, Mireia B. ; Varea, Aïda ; Blázquez, Oriol ; Vescio, Giovanni ; Campabadal, Francesca ; Hernández, Sergi ; Cirera, Albert ; Garrido, Blas ; Estradé, Sònia ; Peiró, Francesca ; Cornet, Albert Abstract Publication: Microscopy and Microanalysis Pub Date: February 2019 DOI: 10.1017/S1431927618016082 Bibcode: 2019MiMic..25S..71M