Radiation Response of Negative Gate Biased SiC MOSFETs Takeyama, Akinori ; Makino, Takahiro ; Okubo, Shuichi ; Tanaka, Yuki ; Yoshie, Toru ; Hijikata, Yasuto ; Ohshima, Takeshi Abstract Publication: Materials Pub Date: August 2019 DOI: 10.3390/ma12172741 Bibcode: 2019Mate...12.2741T