Investigating ice surfaces formed near the freezing point in the vapor phase via atomic force microscopy
Abstract
An atomic force microscope (AFM) using a qPlus sensor was developed to observe ice surfaces grown near the freezing point in the vapor phase. The AFM system was equipped with multi-environmental control mechanisms for the temperature, humidity, and pressure of the introduced gas and the substrate temperature. Topographic images of the basal face of the ice, grown from a supersaturated water vapor, were obtained near equilibrium conditions via frequency modulation AFM (FM-AFM). Surface morphologies corresponding to steps and terraces were successfully observed. Force-curve measurements were also performed on the ice surfaces using FM-AFM. The results can be explained by the quasi-liquid layer on the ice surface.
- Publication:
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Japanese Journal of Applied Physics
- Pub Date:
- August 2019
- DOI:
- 10.7567/1347-4065/ab203d
- Bibcode:
- 2019JaJAP..58IIA09M