Comprehensive Investigations on Degradations of Dynamic Characteristics for SiC Power MOSFETs Under Repetitive Avalanche Shocks
Abstract
- Publication:
-
IEEE Transactions on Power Electronics
- Pub Date:
- March 2019
- DOI:
- 10.1109/TPEL.2018.2843559
- Bibcode:
- 2019ITPE...34.2748W