Outstanding Reliability of Heavy-Ion-Irradiated AlInN/GaN on Silicon HFETs Vega, Nahuel A. ; Challa, Seshagiri R. ; Ferreyra, Romualdo A. ; Kristukat, Christian ; Muller, Nahuel A. ; Debray, Mario E. ; Schmidt, Gordon ; Witte, Hartmut ; Christen, Jurgen ; Dadgar, Armin ; Strittmatter, Andre Abstract Publication: IEEE Transactions on Nuclear Science Pub Date: December 2019 DOI: 10.1109/TNS.2019.2954216 Bibcode: 2019ITNS...66.2417V