Characterization and Mitigation of Single-Event Transients in Xilinx 45-nm SRAM-Based FPGA
Abstract
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- June 2019
- DOI:
- 10.1109/TNS.2019.2916151
- Bibcode:
- 2019ITNS...66..946K