Gate Damages Induced in SiC Power MOSFETs During Heavy-Ion Irradiation—Part I Abbate, C. ; Busatto, G. ; Tedesco, D. ; Sanseverino, A. ; Silvestrin, L. ; Velardi, Francesco ; Wyss, J. Abstract Publication: IEEE Transactions on Electron Devices Pub Date: October 2019 DOI: 10.1109/TED.2019.2931081 Bibcode: 2019ITED...66.4235A