Investigations on the Degradations of Double-Trench SiC Power MOSFETs Under Repetitive Avalanche Stress
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- January 2019
- DOI:
- 10.1109/TED.2018.2875080
- Bibcode:
- 2019ITED...66..546W