An Enhanced Gate-Grounded NMOSFET for Robust ESD Applications Du, Feibo ; Song, Shiyu ; Hou, Fei ; Song, Wenqiang ; Chen, Long ; Liu, Jizhi ; Liu, Zhiwei ; Liou, Juin J. Abstract Publication: IEEE Electron Device Letters Pub Date: September 2019 DOI: 10.1109/LED.2019.2926103 Bibcode: 2019IEDL...40.1491D