Circuit fault diagnosis using quantum annealing and other spin glass solvers
Abstract
In this work we present a novel approach to solving circuit fault diagnosis (CFD) problems using quantum annealers and other spin glass solvers, such as simulated annealing and parallel tempering. The cost function we construct does not minimize the number of faults but rather the distance between real and model circuit outputs: as such it has the attractive property of processing multiple circuit input/output pairs contrary to existing schemes. By showcasing the algorithms' performance through comparison of various metrics, such as time-to-solution, we aim to offer a fresh perspective on using real world-applicative problems in order to understand the nature of quantum annealing optimizers.
The research is based upon work (partially) supported by the Office of the Director of National Intelligence (ODNI), Intelligence Advanced Research Projects Activity (IARPA), via the U.S. Army Research Office contract W911NF-17-C-0050. This material is based on research sponsored by AFRL under agreement number FA8750-18-1-0109.- Publication:
-
APS March Meeting Abstracts
- Pub Date:
- 2019
- Bibcode:
- 2019APS..MARL42003R