Ultrafast Electron Diffraction for the Dynamical Study of 2D Materials Petruk, A. A. ; Rivas, Nicolas ; Dekker, T. ; Pichugin, K. ; Tsen, A. W. ; Sciaini, G. Abstract Publication: Microscopy and Microanalysis Pub Date: August 2018 DOI: 10.1017/S1431927618008474 Bibcode: 2018MiMic..24S1598P