Atomic Electron Tomography: Adding a New Dimension to See Single Atoms in Materials Miao, Jianwei ; Yang, Yongsoo ; Zhou, Jihan ; Tian, Xuezeng ; Yang, Yao ; Kim, Dennis S. ; Pryor, Alan ; Ercius, Peter ; Ophus, Colin ; Scott, M. C. ; Chen, Chien-Chun ; Theis, Wolfgang ; Eisenbach, Markus ; Kent, Paul R. C. ; Sabirianov, Renat F. ; Zeng, Hao Abstract Publication: Microscopy and Microanalysis Pub Date: August 2018 DOI: 10.1017/S1431927618003288 Bibcode: 2018MiMic..24S.558M