X-ray Phase Contrast Imaging Technique Using Bilens Interferometer. Zverev, D. ; Snigireva, I. ; Kohn, V. ; Kuznetsov, S. ; Yunkin, V. ; Snigirev, A. Abstract Publication: Microscopy and Microanalysis Pub Date: August 2018 DOI: 10.1017/S1431927618013193 Bibcode: 2018MiMic..24S.164Z