A Compact Vibration Reduced Set-up for Scanning nm-XRF and STXM. Lubeck, Janin ; Seim, Christian ; Dehlinger, Aurélie ; Haidl, Andreas ; Hönicke, Philipp ; Kayser, Yves ; Unterumsberger, Rainer ; Fleischmann, Claudia ; Beckhoff, Burkhard Abstract Publication: Microscopy and Microanalysis Pub Date: August 2018 DOI: 10.1017/S1431927618013181 Bibcode: 2018MiMic..24S.162L