Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop Chen, Zhuojun ; Ding, Ding ; Dong, Yemin ; Shan, Yi ; Zhou, Shuxing ; Hu, Yuanyuan ; Zheng, Yunlong ; Peng, Chao ; Chen, Rongmei Abstract Publication: IEEE Transactions on Nuclear Science Pub Date: April 2018 DOI: 10.1109/TNS.2018.2812806 Bibcode: 2018ITNS...65..997C