Exploiting Parallelism and Heterogeneity in a Radiation Effects Test Vehicle for Efficient Single-Event Characterization of Nanoscale Circuits
Abstract
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- January 2018
- DOI:
- 10.1109/TNS.2017.2783260
- Bibcode:
- 2018ITNS...65..486K