Estimation of the Single-Event Upset Sensitivity of Advanced SOI SRAMs Raine, M. ; Gaillardin, M. ; Lagutere, T. ; Duhamel, O. ; Paillet, P. Abstract Publication: IEEE Transactions on Nuclear Science Pub Date: January 2018 DOI: 10.1109/TNS.2017.2779786 Bibcode: 2018ITNS...65..339R