Investigation of Porous Silicon-Based Edge Termination for Planar-Type TRIAC Lu, Bin ; Menard, Samuel ; Morillon, Benjamin ; Alquier, Daniel ; Gautier, Gael Abstract Publication: IEEE Transactions on Electron Devices Pub Date: February 2018 DOI: 10.1109/TED.2017.2786143 Bibcode: 2018ITED...65..655L