Investigation on Current Crowding Effect in IGBTs Yang, Fei ; Chen, Hong ; Tian, Xiaoli ; Bai, Yun ; Zhu, Yangjun Abstract Publication: IEEE Transactions on Electron Devices Pub Date: February 2018 DOI: 10.1109/TED.2017.2782705 Bibcode: 2018ITED...65..636Y