Modeling of Edge Scattering in Graphene Interconnects Contino, Antonino ; Ciofi, Ivan ; Wu, Xiangyu ; Asselberghs, Inge ; Celano, Umberto ; Wilson, Christopher J. ; Tokei, Zsolt ; Groeseneken, Guido ; Soree, Bart Abstract Publication: IEEE Electron Device Letters Pub Date: July 2018 DOI: 10.1109/LED.2018.2833633 Bibcode: 2018IEDL...39.1085C