A Fast V_{th} Measurement (FVM) Technique for NBTI Behavior Characterization Yu, Xiao ; Cheng, Ran ; Liu, Wei ; Qu, Yiming ; Han, Jinghui ; Chen, Bing ; Lu, Jiwu ; Zhao, Yi Abstract Publication: IEEE Electron Device Letters Pub Date: February 2018 DOI: 10.1109/LED.2017.2781243 Bibcode: 2018IEDL...39..172Y