Predicting the No-Failure Microcontroller Operation Probability in a Geostationary Orbit
Abstract
The results of radiation tests of microcontrollers of the ATmega-128 type in a wide range of dose rates and temperatures have been used to estimate the probability of no-failure operation of microcontrollers in real operating conditions. The Eyring function has been used to take into account the temperature effect.
- Publication:
-
Cosmic Research
- Pub Date:
- September 2018
- DOI:
- 10.1134/S0010952518050040
- Bibcode:
- 2018CosRe..56..400K