Detection of nonmagnetic metal thin film using magnetic force microscopy
Abstract
Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a thin film of nonmagnetic metal. The results show good agreement with experimental data obtained by varying the tip height. The phenomenon analyzed here can be applied as a "metal detector" at the nanometer scale and for contactless measurements of sheet resistivity. The detection sensitivity is obtained as a function of oscillation frequency, thus allowing the determination of the best frequency for the phase-shift measurement. The shift in resonance frequency due to the presence of a nonmagnetic metal is also discussed.
- Publication:
-
Applied Physics Letters
- Pub Date:
- December 2018
- DOI:
- 10.1063/1.5079763
- arXiv:
- arXiv:1812.03270
- Bibcode:
- 2018ApPhL.113z1601W
- Keywords:
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- Physics - Applied Physics;
- Condensed Matter - Mesoscale and Nanoscale Physics
- E-Print:
- 4 pages, 5 figures