Evidence of charged puddles and induced dephasing in topological insulator thin films
Abstract
We investigate the dephasing mechanism in bulk insulating topological insulator thin films. The phase coherence length is extracted from magnetoresistance measurements at different temperatures. There is a crossover of the phase coherence length as a function of temperature signifying the role of more than one dephasing mechanism in the system. The dephasing rates have been studied systematically and explained.
- Publication:
-
2nd International Conference on Condensed Matter and Applied Physics (ICC 2017)
- Pub Date:
- May 2018
- DOI:
- 10.1063/1.5032695
- Bibcode:
- 2018AIPC.1953e0040S