XPS and morphological properties of Cr2O3 thin films grown by thermal evaporation method
Abstract
In this paper chromium oxide (Cr2O3) thin films have been prepared onto MgO (0 0 1) substrate by thermal evaporation method at a pressure of about 1 × 10-4 Pa. The morphology of the obtained thin films was investigated. These films show homogeneous and uniform distribution according to AFM images. The XPS measurements of chromium Cr 2p and oxygen O 1s peaks shows a good agreement when compared with another works cited in the literature. The micro-structural analysis, surface morphology and optical properties in the grown films were achieved using X-rays Photoelectron Spectroscopy (XPS), Atomic Force Microscopy (AFM), and Ultraviolet Visible (UV-Vis) spectroscopy.
- Publication:
-
Results in Physics
- Pub Date:
- 2017
- DOI:
- 10.1016/j.rinp.2017.08.036
- Bibcode:
- 2017ResPh...7.3124K
- Keywords:
-
- Thermal evaporation;
- Thin film;
- Cr<SUB>2</SUB>O<SUB>3</SUB>;
- Surface morphology;
- XPS;
- AFM;
- Optical properties