Characterization of digital dispersive spectrometers by low coherence interferometry Martínez-Matos, Ó. ; Rickenstorff, C. ; Zamora, S. ; Izquierdo, J. G. ; Vaveliuk, P. Abstract Publication: Optics Express Pub Date: February 2017 DOI: 10.1364/OE.25.003222 Bibcode: 2017OExpr..25.3222M