Energy Filtered STEM Imaging at 30kV and Below - A New Window into the Nano-World? Sunaoshi, Takeshi ; Shirai, Manabu ; Okada, Satoshi ; Kaji, Kazutoshi ; Voelkl, Edgar Abstract Publication: Microscopy and Microanalysis Pub Date: July 2017 DOI: 10.1017/S1431927617008467 Bibcode: 2017MiMic..23S1560S