Automated 3D Block Preparation Procedure for Focused Ion Beam 3D Analyses Zhong, X. L. ; Withers, P. J. ; Zhang, X. ; Lyon, S. B. ; Burnett, T. L. ; Zhou, X. ; Burke, M. G. Abstract Publication: Microscopy and Microanalysis Pub Date: July 2017 DOI: 10.1017/S1431927617002112 Bibcode: 2017MiMic..23S.286Z