Scanning ion-conductance and atomic force microscope with specialized sphere-shaped nanopippettes
Abstract
A scanning ion-conductance microscope was designed on the basis of scanning probe microscope NanoTutor. The optimal parameters of nanopipettes fabrication were found according to scanning electron microscopy diagnostics, current-distance I (Z) and current-voltage characteristics. A comparison of images of test objects, including biological samples, was carried out in the modes of optical microscopy, atomic force microscopy and scanning ion-conductance microscopy. Sphere-shaped nanopippettes probes were developed and tested to increase the stability of pipettes, reduce invasiveness and improve image quality of atomic force microscopy in tapping mode. The efficiency of sphere-shaped nanopippettes is shown.
- Publication:
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Journal of Physics Conference Series
- Pub Date:
- November 2017
- DOI:
- 10.1088/1742-6596/917/4/042022
- Bibcode:
- 2017JPhCS.917d2022Z